考虑换模操作的双臂组合设备终止暂态调度

    Scheduling of Close-down Process for Dual-armed Cluster Tools with Mask Change Operation

    • 摘要: 随着晶圆加工尺寸的多样化、加工工艺的复杂化,传统的批量加工技术难以适应新的加工需求。因此,为了确保晶圆生产的高效高质,采用自动化组合设备进行晶圆加工显得尤为重要。目前,自动化组合设备在单片晶圆加工技术的应用有效提升了晶圆的生产效率。为了进一步提高组合设备的利用率,本文在不违背晶圆驻留约束的前提下,考虑双臂组合设备在终止暂态中的晶圆加工与腔室换模并行操作的可行性调度。首先,提出基于虚拟晶圆策略的终止暂态的新调度策略,建立新策略下终止暂态的Petri网模型,并提出避免死锁和控制系统运行的变迁触发条件;其次,根据工艺要求和时间特性,考虑不同的调度情形对暂态中的等待时间进行再分配,并编写算法输出暂态中的换模时间和TR的活动序列;最后,通过两个算例验证策略的可行性。实验结果表明,与现场先加工再换模的原加工过程相比,本调度方案在不影响设备终止暂态结束时间的前提下,可有效减少双臂组合设备的单产品晶圆批次切换时间,即最小化换模时间。

       

      Abstract: With the diversification of wafer processing size, the complexity of the processing process, the traditional batch processing technology is difficult to adapt to the new processing needs. Therefore, in order to ensure efficient and high-quality wafer production, the use of automated cluster tools for wafer processing is particularly important, and the application of its monolithic wafer processing technology effectively improves the production efficiency of wafers. In order to further improve the utilisation of the cluster tool, it was considered the feasibility of scheduling the parallel operation of wafer processing and mask change in the close-down process for a dual-armed cluster tool without violating the wafer residency constraint in this paper. First, a new scheduling strategy based on the virtual wafer method was proposed, the Petri net model of the close-down process under a new strategy was established and the transition triggering conditions to avoid deadlock and control system operation were established. Then,according to the process requirements and time characteristics, different scheduling conditions had been considered, the waiting time in the close-down process had been redistributed and the mask changing time and the sequence of manipulator activities had been output.Finally, the feasibility of the strategy was verified by two examples. The experimental results show that the proposed scheduling scheme can effectively reduce the batch switching time of single-product wafers without affecting the close-down time of the termination transient., that is the mask changeover time is minimized,compared with the original process of mask change after wafer processing.

       

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