基于数字孪生的芯片系统级测试装备快速定制设计方法研究
林大钦, 赵荣丽, 赖苑鹏, 刘强
A Rapid Customization Design Method of System-Level Test Equipment for Chips Based on Digital Twins
LIN Daqin, ZHAO Rongli, LAI Yuanpeng, LIU Qiang
工业工程
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2024, (3): 22
-30
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DOI: 10.3969/j.issn.1007-7375.240053
