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Industrial Engineering Journal
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中文
A Rapid Customization Design Method of System-Level Test Equipment for Chips Based on Digital Twins
LIN Daqin, ZHAO Rongli, LAI Yuanpeng, LIU Qiang
Industrial Engineering Journal . 2024, (
3
): 22 -30 . DOI: 10.3969/j.issn.1007-7375.240053