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Defective Rate Control Chart for High Yield Process Based on Multi-dot Alarm Rules

  

  1. Center of System & Industrial Engineering, Zhongyuan University of Technology, Zhengzhou, 450007, China
  • Online:2016-08-30 Published:2016-10-08

Abstract:

A kind of defective rate control chart for high yield process based on multidot alarm rules is proposed to improve the detecting efficiency of cumulative quantity control charts. A Markov chain method is used to calculate average run length of these charts. To illustrate the improved efficiency, the performances of three multi-dot alarm rule charts are compared with normal alarm rule chart. The results show that, when the average run length in control for the four charts reaches 370, the average run length out of control of three multi-dot alarm rule charts decreases respectively by nearly 44%, 40% and 63% of the unchanged alarm rule chart. The efficiency of detecting the increase of defective rate is improved significantly. The design method proposed can increase the speed of control chart to detect rate raise of high yield processes in 40%~60%.

Key words: high yield process, cumulative quantity control charts, average run length