Industrial Engineering Journal ›› 2020, Vol. 23 ›› Issue (3): 154-163.doi: 10.3969/j.issn.1007-7375.2020.03.020

• Practice & Application • Previous Articles    

An Integrating Control Scheme of CSP-T and Spk under the Quality and Cost Constraints

LI Chunzhi1,2, GAN Weihua1, YAN Wei'an1,2   

  1. 1. School of Transportation and Logistics;
    2. Institute of Process Control and Reliability, East China JiaoTong University, Nanchang 330013, China
  • Received:2019-08-04 Published:2020-07-04

Abstract: Multiple level continuous sampling plan (CSP-T) is an on-line process quality control tool. The type I risk and type II risk are both high and the cost constraint cannot be satisfied in CSP-T. An integrating control scheme between CSP-T and Spk is proposed, which can meet quality constraint, being carried out with the least cost and controlling the two types of risk at the given level. The optimal CSP-T plan, driven by the attribute characteristics of the sample, is constructed under the quality and cost constraints. The risk control scheme is presented based on the accurate distribution of the estimation of the process yield index (Spk). The two types of risk can be controlled at the given levels for the stipulated quality and cost constraints. The quality control scheme and the risk control scheme work independently and complementarily. The inspection workload is not increased compared with the traditional CSP-T plan. The feasibility and effectiveness of the proposed scheme are verified by an enterprise case.

Key words: process control, continuous sampling plan, process yield index, cost constraint, quality constraint

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